| 摘要(英) |
With the increasing market demand for small lens applications, small lens manufacturing technology is becoming more sophisticated and widespread. However, it is difficult for current inspection machines to fully inspect small lenses and measure them with both high speed and accuracy. Our laboratory has developed a high-speed, high-throughput automated wavefront aberration measurement system, the purpose of which is to quickly fulfill the detection needs for a large number of small lenses. Its advantage is that the measurement cycle of a single lens only needs to be within 10 seconds, and the non-contact measurement structure can greatly improve the service life of the lens. Even the tested lens can still be mounted on an optical element for use.
Corresponding to the high-speed and high-throughput testing of this instrument, it is necessary to know where the measurement accuracy range of the lens to be tested falls within the entire measurement system. Therefore, this experiment is aimed at the measurement system architecture. The step of aligning the measurement position of the test lens and the subsequent repeated measurement of taking and placing will both cause errors in the conjugate position distance measured on the axis, which will affect the measurement. The power error item of lens measurement should be summarized. |
| 參考文獻 |
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