Cross-sectional sizes and emission wavelengths of regularly patterned GaN and core-shell InGaN/GaN quantum-well nanorod arrays

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Title:	Cross-sectional sizes and emission wavelengths of regularly patterned GaN and core-shell InGaN/GaN quantum-well nanorod arrays
Authors:	姚毓峰;Liao, Che-Hao;Chang, Wen-Ming;Yao, Yu-Feng;Chen, Hao-Tsung;Su, Chia-Ying;Chen, Chih-Yen;Hsieh, Chieh;Chen, Horng-Shyang;Tu, Charng-Gan;Kiang, Yean-Woei;Yang, C. C.;Hsu, Ta-Cheng
Contributors:	資訊電機學院電機工程學系
Keywords:	Cross sections (physics);Emission;Gallium nitrides;Indium gallium nitrides;Nanomaterials;Nanostructure;Quantum wells;Wavelengths
Date:	2013-02-07
Issue Date:	2026-04-23 13:46:40 (UTC+8)
Publisher:	American Institute of Physics;AIP Publishing
Abstract:	摘要： The cross-sectional sizes of the regularly patterned GaN nanorods (NRs) and InGaN/GaN quantum-well (QW) NRs of different heights and different hexagon orientations, which are grown on the patterned templates of different hole diameters, pitches, and crystal orientations, are compared. It is found that the cross-sectional size of the GaN NR, which is formed with the pulsed growth mode, is mainly controlled by the patterned hole diameter, and the thickness of the sidewall QW structure is mainly determined by the NR height. The cross-sectional size variation of GaN NR is interpreted by the quasi-three-dimensional nature of atom supply amount for precipitating a two-dimensional disk-shaped NR segment. The variation of the sidewall QW structure is explained by the condition of constituent atom supply in the gap volume between the neighboring NRs. Also, we compare the cathodoluminescence emission wavelengths among those samples of different growth conditions. Generally speaking, the QW NR with a smaller height, a larger cross-sectional size, or a larger pitch has a longer emission wavelength. 出版者： AIP Publishing 出版日期： 2013-02-07 出處： Journal of Applied Physics, 2013-02, Vol.113 (5) 資源來源： AIP Journals (American Institute of Physics) 識別號： ISSN: 0021-8979 識別號： EISSN: 1089-7550 識別號： DOI: 10.1063/1.4790710
Appears in Collections:	[Department of Electrical Engineering] journal & Dissertation

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