Testing and diagnosis methodologies for embedded content addressable memories

NCUIR > College of Electrical Engineering & Computer Science > Graduate Institute of Electrical Engineering > journal & Dissertation > Item 987654321/32505

Please use this identifier to cite or link to this item: https://ir.lib.ncu.edu.tw/handle/987654321/32505

Title:	Testing and diagnosis methodologies for embedded content addressable memories
Authors:	Li,JF;Tzeng,RS;Wu,CW
Contributors:	電機工程研究所
Keywords:	ALGORITHMS
Date:	2003
Issue Date:	2010-07-06 18:30:04 (UTC+8)
Publisher:	中央大學
Abstract:	Embedded content addressable memories (CAMs) are important components in many system chips where most CAMs are customized and have wide words. This poses challenges on testing and diagnosis. In this paper two efficient March-like test algorithms are propo
Relation:	JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
Appears in Collections:	[Graduate Institute of Electrical Engineering] journal & Dissertation

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