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Zr-based metallic glass thin film c...
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显示项目401-423 / 423. (共17页)
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日期
题名
作者
2006
Cross-interaction between Au and Cu in Au/Sn/Cu ternary diffusion couples
Chang CW,Lee QP,Ho CE,Kao CR
2006
Current density dependence of electromigration-induced flip-chip Cu pad consumption
Lin,C. T.
;
Chuang,Y. C.
;
Wang,S. J.
;
Liu,C. Y.
2006
Effect of Fe and Si on properties of squeezed aluminium metal matrix Nd-Fe-B composite magnets
Chuang,S. -F.
;
Lee,S. -L.
;
Lin,F. -J.
;
Lin,J. -C.
2006
Effect of heat treatments on the tensile strength and SCC-resistance of AA7050 in an alkaline saline solution
Lin,Jing-Chie
;
Liao,Hsueh-Lung
;
Jehng,Wern-Dare
;
Chang,Chih-Horng
;
Lee,Sheng-Long
2006
Effects of limited Cu supply on soldering reactions between SnAgCu and Ni
Ho CE,Lin YW,Yang SC,Kao CR,Jiang DS
2006
Effects of strain ratio and tensile hold time on low-cycle fatigue of lead-free Sn-3.5Ag-0.5Cu solder
Lin CK,Huang CM
2006
Electromigration-induced UBM consumption and the resulting failure mechanisms in flip-chip solder joints
Lin YL,Chang CW,Tsai CM,Lee CW,Kao CR
2006
Fabrication of periodic nickel silicide nanodot arrays using nanosphere lithography
Cheng SL,Lu SW,Li CH,Chang YC,Huang CK,Chen H
2006
Local melting induced by electromigration in flip-chip solder joints
Tsai CM,Lin YL,Tsai JY,Lai YS,Kao CR
2006
Microstructure evolution of gold-tin eutectic solder on Cu and Ni substrates
Tsai JY,Chang CW,Ho CE,Lin YL,Kao CR
2006
Polymorph farming of Acetaminophen and Sulfathiazole on a chip
Lee,Tu
;
Hung,Shi Ting
;
Kuo,Chung Shin
2006
Prevention of electromigration-induced Cu pad dissolution by using a high electromigration-resistance ternary Cu-Ni-Sn layer
Hsiao YH,Chuang YC,Liu CY
2006
Study of electromigration-induced Cu consumption in the flip-chip Sn/Cu solder bumps
Liu,C. Y.
;
Ke,Lin
;
Chuang,Y. C.
;
Wang,S. J.
2006
Study of wetting reaction between eutectic AuSn and Au foil
Lai YT,Liu CY
2006
Thermomigration in eutectic SnPb alloy
Chuang YC,Liu CY
2005
Effect of Ag content and heat treatment on the stress corrosion cracking of Al-4.6Cu-0.3Mg alloy
Chang,CH
;
Lee,SL
;
Lin,JC
;
Yeh,MS
;
Jeng,RR
2005
Effects of Be and Fe on the mechanical and corrosion behaviors of A357 alloys
Yang,CY
;
Lee,SL
;
Lee,CK
;
Lin,JC
2005
Effects of lead and copper particles on corrosion and wear behaviour of Al-Si matrix composites
Chuang,SF
;
Wu,TF
;
Lee,SL
;
Kao,CH
;
Lin,JC
;
Lee,ZK
2005
Electromigration studies of Sn(Cu) and Sn(Ni) alloy stripes
Wei,CC
;
Liu,CY
2005
High-thermal-stability and low-resistance p-GaN contact for thin-GaN light emitting diodes structure
Lin,CL
;
Wang,SJ
;
Liu,CY
2005
In situ observation of the void formation-and-propagation mechanism in solder joints under current-stressing
Lin,YH
;
Hu,YC
;
Tsai,CM
;
Kao,CR
;
Tu,KN
2005
Solid-state reactions between Ni and Sn-Ag-Cu solders with different Cu concentrations
Luo,WC
;
Ho,CE
;
Tsai,JY
;
Lin,YL
;
Kao,CR
2005
The effect of silver content on the precipitation of the Al-4.6Cu-0.3Mg alloy
Chang,CH
;
Lee,SL
;
Lin,JC
;
Jeng,RR
显示项目401-423 / 423. (共17页)
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