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    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/34344


    Title: Nanoscale measurements of conducting domains and current - Voltage characteristics of chemically deposited polyaniline films
    Authors: Wu,CG;Chang,SS
    Contributors: 化學研究所
    Keywords: ATOMIC-FORCE MICROSCOPY;SELF-ASSEMBLED MONOLAYERS;SCANNING ELECTROCHEMICAL MICROSCOPY;TO-METAL TRANSITION;MOLECULAR ELECTRONICS;TUNNELING-MICROSCOPY;DOPANT DISTRIBUTION;CHARGE-TRANSPORT;POLYPYRROLE;POLYMERS
    Date: 2005
    Issue Date: 2010-07-07 12:02:37 (UTC+8)
    Publisher: 中央大學
    Abstract: Spatial variations in electric conductivity and evolutions of band structures of polyaniline (PANI) films have been studied by use of a so-called current-sensing atomic force microscope (CS-AFM) or atomic force microscope current image tunneling spectrosc
    Relation: JOURNAL OF PHYSICAL CHEMISTRY B
    Appears in Collections:[Graduate Institute of Chemistry] journal & Dissertation

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