Accelerated Life Tests for Weibull Series Systems With Masked Data

Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/51852

Title:	Accelerated Life Tests for Weibull Series Systems With Masked Data
Authors:	Fan,TH;Wang,WL
Contributors:	統計研究所
Keywords:	MAXIMUM-LIKELIHOOD ANALYSIS;COMPETING RISKS;COMPONENT-RELIABILITY;BAYESIAN-ANALYSIS;INCOMPLETE DATA;EM ALGORITHM;FAILURE DATA;STEP;MODEL;SURVIVAL
Date:	2011
Issue Date:	2012-03-27 19:07:41 (UTC+8)
Publisher:	國立中央大學
Abstract:	This article introduces a p-stage step-stress accelerated life test on system products, where each system contains m s-independent non-identical components connected in series, and it fails if any component has broken down. Due to cost considerations or environmental restrictions, masked causes of system failures and type-I censored observations might occur in the collected data. The time to failure under a pre-specified stress environment is described by a Weibull-distributed cumulative exposure model. A computationally feasible procedure based on the hybrid EM-NR algorithm is developed for maximum likelihood estimation of the model. Further, the reliability of the system and components are estimated at a specified time under usual operating conditions. The proposed method is illustrated through a numerical example and a simulation study under various masking levels.
Relation:	IEEE TRANSACTIONS ON RELIABILITY
Appears in Collections:	[統計研究所] 期刊論文

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