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    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/54555


    Title: LED 背光模組靜電放電路徑;Study on Electrostatic Discharge Paths in LED Backlight Module
    Authors: 蘇潮源;Su,Chao-Yuan
    Contributors: 電機工程研究所碩士在職專班
    Keywords: 靜電;靜電放電;系統ESD;ESD;system ESD;system level ESD
    Date: 2012-07-24
    Issue Date: 2012-09-11 18:53:59 (UTC+8)
    Publisher: 國立中央大學
    Abstract: TFT-LCD ( Thin Film Transistor Liquid Crystal Display ) 已廣泛的應用在我們的生活用品上,平面電視、筆記型電腦以及手機等都是以 TFT-LCD 為顯示器。而為了讓手持式裝置更加輕薄可攜、提高面版解析度,增長電池使用時間,LED 背光源 ( Light-Emitting-Diode Backlight ) 便成為趨勢。經由摩擦或是感應產生的靜電放電 (Electrostatic Discharge) 現象是造成產品異常的主要原因之一,可能造成產品的直接物理破壞或是潛在的物理破壞,形成可靠度的問題。因此在電子產品的應用上,除了功能外,靜電防護也是探討的重點,目的是預防產品受到靜電放電時的破壞,造成產品功能失效,減少成本的浪費。在面板組裝過程中會有一定的比例的產品會因ESD而造成產品異常,探討 LED Backlight 模組的靜電放電路徑除了有助我們更加了解整個系統靜電放電途徑外,也讓我們知道該系統的抗靜電能力何處比較弱,進一步加強該部份的 ESD 能力,提高整個系統抗 ESD 能力,減少因靜電放電而產生產品失效或是可靠度的問題。TFT-LCD ( Thin Film Transistor Liquid Crystal Display ) has generally used in electrical products in our life, monitors in LCD TV, Notebook and cell phone are popular application. For mobile products, thick and higher resolution monitor, saving battery energy are getting more and more important. Therefore, LED ( Light-Emitting-Diode ) backlight become the key product in the future.ESD (Electrostatic Discharge ) caused by triboelectric charging and induction, or contact another charged object, it will make electrical products malfunction or failure, and it can change the electrical characteristics of a semiconductor device, degrading or destroying it, become reliability issue. So besides function, ESD is become more and more important, not only function guarantee, but also reduce reliability issue, saving cost.In panel assembly process, it might suffer ESD damage and product function become abnormal, Through studying on Electrostatic Discharge paths in LED backlight module, we can realize the ESD paths and find out the weak point, and knowing how to improve the system level ESD, finally reduce system function fail or reliability case .
    Appears in Collections:[Executive Master of Electrical Engineering] Electronic Thesis & Dissertation

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