半導體量子點及合金薄膜之光學特性研究;Optical Properties of Semiconductor Quantum Dots and Alloy Films

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题名:	半導體量子點及合金薄膜之光學特性研究;Optical Properties of Semiconductor Quantum Dots and Alloy Films
作者:	徐子民;鄭劭家
贡献者:	國立中央大學物理學系
关键词:	物理;光電工程
日期:	2012-12-01
上传时间:	2014-03-17 12:00:54 (UTC+8)
出版者:	行政院國家科學委員會
摘要:	研究期間：10108~10207;The InGaAs quantum dots, Ge quantum dots and the ZnSe1-xOx alloy films are materials which are important for photonic device applications. In this project, we propose to study the photon emission properties of these materials. For the InGaAs quantum dot system, we focus on the laser properties of quantum dots embedded in q-L2 photonic crystal nanocavity; and the development of the AFM oxidization technique on the photonic crystal nanocavity. For the Ge quantum dot, the enhancement of quantum dot direct emission will be investigated. In the ZnSe1-xOx alloy films, we will study the mechanism of energy band gap reduction. Spectral characteristics of these materials will be performed using the micro-photoluminescence and time-resolved photoluminescence, HBT interferometer, Michelson interferometer, and the photoreflectance. Experimental results will be compared with the theories.
關聯:	財團法人國家實驗研究院科技政策研究與資訊中心
显示于类别:	[物理學系] 研究計畫

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