心理壓力對於長期記憶中測驗效果的影響;The Modulation of Stress on the Testing Effect in Long-Term Memory

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Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/73570

Title:	心理壓力對於長期記憶中測驗效果的影響;The Modulation of Stress on the Testing Effect in Long-Term Memory
Authors:	鄭仕坤
Contributors:	國立中央大學認知與神經科學研究所
Keywords:	心理學
Date:	2017-08-01
Issue Date:	2017-08-02 12:05:52 (UTC+8)
Publisher:	科技部
Abstract:	研究期間：10601 ~ 10612
Relation:	財團法人國家實驗研究院科技政策研究與資訊中心
Appears in Collections:	[College of Science Institute of Cognitive Neuroscience] Research Project

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