使用方解石於?位全像顯微系統的深?測?系統;Depth Measurement in Digital Holographic Microscope System Using Calcite

NCU Institutional Repository > 理學院 > 光電科學研究所 > 博碩士論文 > Item 987654321/86094

jsp.display-item.identifier=請使用永久網址來引用或連結此文件: http://ir.lib.ncu.edu.tw/handle/987654321/86094

题名:	使用方解石於?位全像顯微系統的深?測?系統;Depth Measurement in Digital Holographic Microscope System Using Calcite
作者:	吳楊榮浩;Rong-Hao, Wu-Yang
贡献者:	光電科學與工程學系
关键词:	深?測?;?位全像;雙折射;?位全像顯微鏡
日期:	2021-10-14
上传时间:	2021-12-07 12:01:54 (UTC+8)
出版者:	國立中央大學
摘要:	本?文提出使用方解石?使顯微系統所獲取的二維影像帶有深?資訊，並透過同軸?位全像系統?解決顯微系統景深問題。我們?用方解石晶體的雙折射現象，將經過方解石後所產生?影像的距?視作物體高?，藉由經過顯微系統所接收到的影像高?，?判斷物體所在之深?。針對顯微系統景深過短的問題，我們使用同軸式?位全像?進?影像重新對焦，解決景深過短之問題。實驗包括單一物體改變深?之測?以及同時測?? ?同深?之物體?種，並分析影響系統極限表現之因素。;In this thesis, we proposed the method that we use calcite to make the two-dimensional image captured by a microscope system obtain depth information. In addition, we use the in-line digital holography system to solve the problem of depth of view in microscope system. We use the double refraction phenomenon to take the distance between the two images passing through the calcite as the object height. Then determine the depth of the object by the captured image height, which passed through the microscope system. To solve the problem of depth of view in microscope system, we use in-line digital holography to refocus the image. In the experiment, the results included two sections. First is measuring depth of one object by changing the depth location, and the other is measuring depth of two objects at the same time. Finally, we analyzed the factor affecting the extremum performance of the system.
显示于类别:	[光電科學研究所] 博碩士論文

文件中的档案:

档案	描述	大小	格式	浏览次数
index.html		0Kb	HTML	93	检视/开启

在NCUIR中所有的数据项都受到原著作权保护.

社群 sharing

数据加载中.....