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顯示項目476-491 / 491. (共20頁) << < 11 12 13 14 15 16 17 18 19 20  每頁顯示[10|25|50]項目

日期	題名	作者
2000	Nonalloyed GaAs metal-semiconductor field effect transistor	Lee,CT; Huang,JH; Tsai,CD
2000	Novel measurement method for fiber optical cable television echo rating baseband parameter at subscriber	Lu,HH; Lee,CT
2000	Observation of less heat generation and investigation of its effect on the stability range of a Nd : YAG laser	Cheng,CC; Huang,TL; Chang,SH; Tsai,HS; Liu,HP
2000	Ohmic performance comparison for Ti/Ni/Au and Ti/Pt/Au on InAs/graded InGaAs/GaAs layers	Lyu,YT; Jaw,KL; Lee,CT; Tsai,CD; Lin,YJ; Cherng,YT
2000	Ophthalmic lens design with the optimization of the aspherical coefficients	Sun,WS; Tien,CL; Sun,CC; Chang,MW; Chang,H
2000	Ordinary polarized phase conjugator using the photovoltaic effect	Yau,HF; Kung,HC; Lee,HY; Sun,CC; Chen,TC; Chang,CC; Tong,YP; Chen,J
2000	Passivation mechanism analysis of sulfur-passivated InGaP surfaces using x-ray photoelectron spectroscopy	Tsai,CD; Lee,CT
2000	Passive Q-switch and mode-locking modulators for Nd : hosted lasers	Chen,JW; Yau,HF; Liu,HP; Chen,TC; Cheng,CC; Liu,FM
2000	Passive Q-switches for Nd : hosted solid state lasers	Chen,JW; Kung,HC; Yu,HF; Liu,HP; Chen,TC; Cheng,CC
2000	Polarization properties and frequency stabilization of an internal-mirror 1523 nm He-Ne laser under axial magnetic field	Huang,TL; Shy,JT; Lin,T; Liu,HP
2000	Shift-tolerance property of an optical double-random phase-encoding encryption system	Wang,B; Sun,CC; Su,WC; Chiou,AET
2000	Simultaneous determination of the thermal expansion coefficient and the elastic modulus of Ta2O5 thin film using phase shifting interferometry	Tien,CL; Jaing,CC; Lee,CC; Chuang,KP
2000	Sub-Doppler spectroscopy of molecular iodine at 531 nm using a frequency-doubled alpha-distributed feedback laser	Huang,TL; Cheng,WY; Lin,YR; Shy,JT; Liu,HP
2000	Systematic synthesis of R-L and C-D immittances using single CCIII	Wang,HY; Lee,CT
2000	The measurement of thin film stress using phase shifting interferometry	Tien,CL; Lee,CC; Jaing,CC
2000	X-ray photoelectron spectroscopy study of (NH4)(2)S-x-treated Mg-doped GaN layers	Lin,YJ; Tsai,CD; Lyu,YT; Lee,CT

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