An energy-dependent photoemission study on line-shape analysis in determining the absolute coverage of metallic thin films

Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/38164

Title:	An energy-dependent photoemission study on line-shape analysis in determining the absolute coverage of metallic thin films
Authors:	Cheng,Cheng-Maw;Tsuei,Ku-Ding;Luh,Dah-An
Contributors:	物理研究所
Keywords:	CROSS-SECTION;SURFACE-STATE;RESONANCES
Date:	2008
Issue Date:	2010-07-08 13:18:59 (UTC+8)
Publisher:	中央大學
Abstract:	Energy-dependent photoemission was measured to investigate the validity of the analysis of line shape in determining the absolute coverage of atomically flat, metallic thin films. The surface states of two Ag/Au(1 1 1) thin films with carefully controlled
Relation:	JOURNAL OF PHYSICS D-APPLIED PHYSICS????
Appears in Collections:	[Graduate Institute of Physics] journal & Dissertation

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