中大機構典藏-NCU Institutional Repository-提供博碩士論文、考古題、期刊論文、研究計畫等下載:Items for Author

中大機構典藏-NCU Institutional Repository-提供博碩士論文、考古題、期刊論文、研究計畫等下載:Items for Author

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Items for Author "Li,JF"

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Showing 16 items.

Collection	Date	Title	Authors	Bitstream
[土木工程研究所] 期刊論文	2004	Evaluation of asymptotic stress field around a crack tip for Neo-Hookean hyperelastic materials	Chang,JH; Li,JF
[電機工程研究所] 期刊論文	2005	A built-in self-repair design for RAMs with 2-D redundancy	Li,JF; Yeh,JC; Huang,RF; Wu,CW
[電機工程研究所] 期刊論文	2004	Diagnosing binary content addressable memories with comparison and RAM faults	Li,JF
[電機工程研究所] 期刊論文	2004	Efficient block-level connectivity verification algorithms for embedded memories	Li,JF
[電機工程研究所] 期刊論文	2003	Built-in redundancy analysis for memory yield improvement	Huang,CT; Wu,CF; Li,JF; Wu,CW
[電機工程研究所] 期刊論文	2003	Testing and diagnosis methodologies for embedded content addressable memories	Li,JF; Tzeng,RS; Wu,CW
[電機工程研究所] 期刊論文	2002	A hierarchical test methodology for systems on chip	Li,JF; Huang,HJ; Chen,JB; Su,CP; Wu,CW; Cheng,C; Chen,SI; Hwang,CY; Lin,HP
[電機工程學系] 期刊論文	2011	A Low-Cost Built-In Redundancy-Analysis Scheme for Word-Oriented RAMs With 2-D Redundancy	Tseng,TW; Li,JF
[電機工程學系] 期刊論文	2011	Memory Built-In Self-Repair Planning Framework for RAMs in SoCs	Hou,CS; Li,JF; Tseng,TW
[電機工程學系] 期刊論文	2011	SETBIST: An Soft-Error Tolerant Built-In Self-Test Scheme for Random Access Memories	Tseng,TW; Li,JF
[電機工程學系] 期刊論文	2010	A Built-in Method to Repair SoC RAMs in Parallel	Tseng,TW; Li,JF; Hou,CS
[電機工程學系] 期刊論文	2010	DABISR: A Defect-Aware Built-In Self-Repair Scheme for Single/Multi-Port RAMs in SoCs	Tseng,TW; Huang,YJ; Li,JF
[電機工程學系] 期刊論文	2010	ReBISR: A Reconfigurable Built-In Self-Repair Scheme for Random Access Memories in SOCs	Tseng,TW; Li,JF; Hsu,CC
[電機工程學系] 期刊論文	2010	Reliability-Enhancement and Self-Repair Schemes for SRAMs With Static and Dynamic Faults	Li,JF; Tseng,TW; Hou,CS
[電機工程學系] 期刊論文	2010	Testing Comparison and Delay Faults of TCAMs With Asymmetric Cells	Li,JF
[電機工程學系] 期刊論文	2010	Testing Random Defect and Process Variation Induced Comparison Faults of TCAMs with Asymmetric Cells	Li,JF; Huang,YJ; Hu,YJ

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