English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 94459/94459 (100%)
造訪人次 : 87653193      線上人數 : 281
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
搜尋範圍 查詢小技巧：
  • 您可在西文檢索詞彙前後加上"雙引號"，以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋，建議至進階搜尋限定作者欄位，可獲得較完整資料
    •  進階搜尋

    類別瀏覽

    正在載入社群分類, 請稍候....

    年代瀏覽

    正在載入年代分類, 請稍候....

    "Wu, Cheng-Wen"的相關文件 

    回到依作者瀏覽

    顯示 13 項.

    類別 日期 題名 作者 檔案
    [歷史研究所] 期刊論文 2016-04-01 Configurable Cubical Redundancy Schemes for Channel-Based 3-D DRAM Yield Improvement 鄭政誠; Lin, Bing-Yang; Chiang, Wan-Ting; Wu, Cheng-Wen; Lee, Mincent; Lin, Hung-Chih; Peng, Ching-Nen; Wang, Min-Jer
    [歷史研究所] 期刊論文 2016-03-01 A local parallel search approach for memory failure pattern identification 鄭政誠; Lin, Bing-Yang; Wu, Cheng-Wen; Lee, Mincent; Lin, Hung-Chih; Peng, Ching-Nen; Wang, Min-Jer
    [歷史研究所] 期刊論文 2015-01-01 RRAM defect modeling and failure analysis based on march test and a novel squeeze-search scheme 鄭政誠; Chen, Ching-Yi; Shih, Hsiu-Chuan; Wu, Cheng-Wen; Lin, Chih-He; Chiu, Pi-Feng; Sheu, Shyh-Shyuan; Chen, Frederick T.
    [歷史研究所] 期刊論文 2014-11-01 Low-cost post-bond testing of 3-D ICs containing a passive silicon interposer base 鄭政誠; Chi, Chun-Chuan; Marinissen, Erik Jan; Goel, Sandeep Kumar; Wu, Cheng-Wen
    [歷史研究所] 期刊論文 2014-02-01 Application-independent testing of 3-D field programmable gate array interconnect faults 鄭政誠; Peng, Yen-Lin; Kwai, Ding-Ming; Chou, Yung-Fa; Wu, Cheng-Wen
    [歷史研究所] 期刊論文 2014-01-01 DArT: A component-based DRAM area, power, and timing modeling tool 鄭政誠; Shih, Hsiu-Chuan; Luo, Pei-Wen; Yeh, Jen-Chieh; Lin, Shu-Yen; Kwai, Ding-Ming; Lu, Shih-Lien; Schaefer, Andre; Wu, Cheng-Wen
    [歷史研究所] 期刊論文 2014-01-01 On improving interconnect defect diagnosis resolution and yield for interposer-based 3-D ICs 鄭政誠; Chi, Chun-Chuan; Lin, Bing-Yang; Wu, Cheng-Wen; Wang, Min-Jer; Lin, Hung-Chih; Peng, Ching-Neng
    [歷史研究所] 期刊論文 2013-06-05 Generalization of an enhanced ECC methodology for low power PSRAM 鄭政誠; Chen, Po-Yuan; Su, Chin-Lung; Chen, Chao-Hsun; Wu, Cheng-Wen
    [歷史研究所] 期刊論文 2013-01-01 AC-plus scan methodology for small delay testing and characterization 鄭政誠; Li, Tsung-Yeh; Huang, Shi-Yu; Hsu, Hsuan-Jung; Tzeng, Chao-Wen; Huang, Chih-Tsun; Liou, Jing-Jia; Ma, Hsi-Pin; Huang, Po-Chiun; Bor, Jenn-Chyou; Tien, Ching-Cheng; Wang, Chih-Hu; Wu, Cheng-Wen
    [歷史研究所] 期刊論文 2013-01-01 In-situ method for TSV delay testing and characterization using input sensitivity analysis 鄭政誠; You, Jhih-Wei; Huang, Shi-Yu; Lin, Yu-Hsiang; Tsai, Meng-Hsiu; Kwai, Ding-Ming; Chou, Yung-Fa; Wu, Cheng-Wen
    [歷史研究所] 期刊論文 2013-01-01 Low-cost error tolerance scheme for 3-D CMOS imagers 鄭政誠; Chang, Hsiu-Ming Chang; Huang, Jiun-Lang; Kwai, Ding-Ming; Cheng, Kwang-Ting; Wu, Cheng-Wen
    [歷史研究所] 期刊論文 2013-01-01 Reactivation of spares for off-chip memory repair after die stacking in a 3-D IC with TSVs 鄭政誠; Chou, Yung-Fa; Kwai, Ding-Ming; Shieh, Ming-Der; Wu, Cheng-Wen
    [歷史研究所] 期刊論文 2013-01-01 Write current self-configuration scheme for MRAM yield improvement 鄭政誠; Chen, Ching-Yi; Wang, Sheng-Hung; Wu, Cheng-Wen

    ::: Copyright National Central University. | 國立中央大學圖書館版權所有 | 收藏本站 | 設為首頁 | 最佳瀏覽畫面: 1024*768 | 建站日期：8-24-2009 :::
    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 隱私權政策聲明